Wait a second...
Nepřihlášený uživatel
You are here: UCT PragueCentral Laboratories → Laboratory of Surface Analysis → Instruments
iduzel: 27524
idvazba: 34992
šablona: stranka
čas: 19.8.2022 21:40:20
verze: 5139
uzivatel:
remoteAPIs:
branch: trunk
Server: 147.33.89.150
Obnovit | RAW

Laboratory of Surface Analysis

The ESCA Probe P made by Omicron Nanotechnology in 2004 is available for all types of measurements which are presented in following text. The instrument is equipped with monochromator, two types of ion guns, electron detection system with 5 chaneltrons, with source of low energy electrons for charge compensation, source of ultraviolet ray for UPS (ultraviolet photoelectron spectroscopy) for analyses of valence electrons, with detector of secondary electrons and with source of electrons for Auger spectroscopy.

originál

Configuration of instrument

ESCA Probe P consists of analysis chamber, preparation chamber, entry chamber combined with exposition chamber, which is designed for high temperature and high pressure exposition of measured samples. Ion gun and evaporator are connected to preparation chamber, more sophisticated ion gun is connected to analyses chamber. Hemispherical detector with 5 chaneltrons, monochromated source of X-ray, detector of secondary electrons, focused electron source for Auger analyses, low energy electron source for compensation and LEED (low energy electron diffraction) and dual x-ray source are available for measurement on analyses chamber.

Experimental conditions: Analysis is carried out under UHV condition (UHV Ultra High Vaccum - aprox. 10E-10 mbar). It is possible to measure under elevated temperature (up to 400°C), and under low temperature (near temperature of liquid nitrogen).

Area analyzed by XPS: The analysed area depends on the setting of instrument and extends from diameter approx. 70 μm to diameter 1.3 mm.

Available techniques

XPS - X-ray Photoelectron Spectroscopy
UPS - Ultraviolet Photoelectron Spectroscopy
SEM - Scanning Electron Microscopy with low lateral resolution (1 μm)
SAM - Scanning Auger Microscopy – available mapping of elementary composition of surface with the same lateral resolution as SEM
LEED - Low energy electron diffraction

Updated: 1.6.2016 12:54, Author: Jan Prchal

Information

×


UCT Prague
Technická 5
166 28 Prague 6 – Dejvice
IČO: 60461373 / VAT: CZ60461373

Czech Post certified digital mail code: sp4j9ch

Copyright: UCT Prague 2015
Information provided by the Department of International Relations and the Department of R&D. Technical support by the Computing Centre.
switch to full version